Lunch Seminar III:Introduction JEOL Scanning Electron Microscope JSM-7900F and How to make a cross section of specimens for observation by Scanning Electron Microscope

  • Mr Tan Teck Siong

    Mr Tan Teck Siong graduated from National University of Singapore with a bachelor degree in Electrical engineering in 1992. He joined Insitutte of Microelectronics in 1993 for one and a half year. After that, he joined JEOL Asia Pte Ltd in 1995 as Country sales manager.
    Currently he is the sales director of JEOL Asia as well as the SEM product manager.

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